Everett Charles Technologies (ECT) announced that the .4mm and .5mm ZIP® Z0 and Z1 performance production contacts are now available in the high-performance HyperCore™ base material.
HyperCore™ is a non-plated homogenous material specifically designed for use in semiconductor test. The proprietary material possesses properties that prevent oxidation, ensuring premium performance throughout high-volume production cycles. With its 600+ Knoop hardness, it is inert to common wear related to contacting tough device surfaces and cleaning processes.
Additionally, HyperCore™ is very conductive. Its electrical specifications are virtually unchanged when compared to gold-plated BeCu yielding premium performance even in the most severe environments.
HyperCore™ plungers are exclusively available on ECT’s high performance ZIP® Z0 and Z1 family of contacts.
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ECT Contact Solutions, including the Ostby Barton/Pylon Division,
is the world's leading manufacturer of POGO ® contact probes for
testing bare and loaded printed circuit boards. Innovations in
design, engineering and manufacturing processes have led the
industry. From the development of the first snap-out or
replaceable probe, in 1965, to more recent designs such as the
high performance bias ball PogoPlus® probe line.
